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PKP Metadata Items |
Metadata for this Document |
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| 1. |
Title |
Title of document |
Surface structural analysis using grazing incidence x-ray reflectometry |
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| 2. |
Creator |
Author's name, affiliation, country |
Y. Ijdiyaou; Laboratoire de Physique du Solide et des Couches Minces, Faculle des Sciences Semlalia. Universile Cadi Ayyad, BP S 15 Marrakech 40 000; Morocco |
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| 2. |
Creator |
Author's name, affiliation, country |
M. Y. Elazhari; Laboratoire de Physique du Solide et des Couches Minces, Faculle des Sciences Semlalia. Universile Cadi Ayyad, BP S 15 Marrakech 40 000; Morocco |
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| 2. |
Creator |
Author's name, affiliation, country |
K. Hafidi; Laboratoire de Physique du Solide et des Couches Minces, Faculle des Sciences Semlalia. Universile Cadi Ayyad, BP S 15 Marrakech 40 000; Morocco |
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| 2. |
Creator |
Author's name, affiliation, country |
M. Azizan; Laboratoire de Physique du Solide et des Couches Minces, Faculle des Sciences Semlalia. Universile Cadi Ayyad, BP S 15 Marrakech 40 000; Morocco |
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| 2. |
Creator |
Author's name, affiliation, country |
E. L. Ameziane; Laboratoire de Physique du Solide et des Couches Minces, Faculle des Sciences Semlalia. Universile Cadi Ayyad, BP S 15 Marrakech 40 000; Morocco |
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| 2. |
Creator |
Author's name, affiliation, country |
A. Outzourhit; Laboratoire de Physique du Solide et des Couches Minces, Faculle des Sciences Semlalia. Universile Cadi Ayyad, BP S 15 Marrakech 40 000; Morocco |
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| 2. |
Creator |
Author's name, affiliation, country |
M. Brunel; Laboraloire de Cristallographie, CNRS, BP 166,38042 Grenoble Cedex 9; France |
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| 3. |
Subject |
Discipline(s) |
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| 3. |
Subject |
Keyword(s) |
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| 4. |
Description |
Abstract |
Grazing incidence X-ray diffraction and reflectometry are used to characterize chemically treated cadmium telluride single crystal (c-CdTe) surfaces, amorphous silicon (a-Si) thin films and amorphous oxygenated cadmium telluride( a-CdTe : O) thin layers. In the case of CdTe single crystal surface treated with an oxidizing agent (a solution of BQ in CH3OH), the superficial layer was found to be less dense than its support with a profound alteration of CdTe in the volume. After rinsing in KOH solution, the properties of single crystalline CdTe are obtained. In the case of a-Si thin layers, we show that the simulation of the reflectometry curves enables not only the determination of the layer thickness but also the detection of an ultra-thin superficial oxide layer. Finally, in the case of a-CdTe: O films it is found that the oxygen contents of the surface increases with increased exposure time. Also, this exposure leads to an increase of the oxide thickness and a net decrease in the surface roughness. |
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| 5. |
Publisher |
Organizing agency, location |
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Contributor |
Sponsor(s) |
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| 7. |
Date |
(YYYY-MM-DD) |
07-03-2011
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| 8. |
Type |
Status & genre |
Peer-reviewed Article |
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| 8. |
Type |
Type |
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| 9. |
Format |
File format |
PDF |
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| 10. |
Identifier |
Uniform Resource Identifier |
https://revues.imist.ma/index.php/MJCM/article/view/21 |
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| 11. |
Source |
Title; vol., no. (year) |
Moroccan Journal of Condensed Matter; Vol 1 (1998) |
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| 12. |
Language |
English=en |
en |
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| 13. |
Relation |
Supp. Files |
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| 14. |
Coverage |
Geo-spatial location, chronological period, research sample (gender, age, etc.) |
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| 15. |
Rights |
Copyright and permissions |
Copyright (c)
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