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Characterisation of the porous silicon layers

  
FEKIH, Z. et al. Characterisation of the porous silicon layers. Moroccan Journal of Condensed Matter, [S.l.], v. 7, mar. 2011. ISSN 1114-2073. Available at: <https://revues.imist.ma/index.php/MJCM/article/view/157>. Date accessed: 15 nov. 2023.