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Electrical characterization of the junctions P+ N by C-V technique

  
BOUCHENAFA, H. et al. Electrical characterization of the junctions P+ N by C-V technique. Moroccan Journal of Condensed Matter, [S.l.], v. 7, mar. 2011. ISSN 1114-2073. Available at: <https://revues.imist.ma/index.php/MJCM/article/view/150/148>. Date accessed: 15 nov. 2023.