How to cite item

Ionizing Radiation Effect on the Electrical Properties of Metal/ultra-thin Oxide/Semiconductor Structures

  
KHLIFI, Y. et al. Ionizing Radiation Effect on the Electrical Properties of Metal/ultra-thin Oxide/Semiconductor Structures. Moroccan Journal of Condensed Matter, [S.l.], v. 6, mar. 2011. ISSN 1114-2073. Available at: <https://revues.imist.ma/index.php/MJCM/article/view/132/130>. Date accessed: 15 nov. 2023.