Wavelet phase evaluation extended to digital speckle patterninterferometry
M.BARJ, E. et al.
Wavelet phase evaluation extended to digital speckle patterninterferometry.
Moroccan Journal of Condensed Matter, [S.l.], v. 5, n. 2, mar. 2011.
ISSN 1114-2073. Available at: <https://revues.imist.ma/index.php/MJCM/article/view/120/118>. Date accessed: 15 nov. 2023.