EVALUATION OF CONTAMINATED IMPLANT SURFACES IRRADIATED By ER, CR: YSGG LASER

GIZEM BERK, RENE FRANZEN, KUBRA ATICI, SEMA S. HAKIL, NUKET BERK, NORBERT GUTKNECHT

Résumé


Background: The aim of the study was to evaluate the efficiency of an Er,Cr:YSGG laser to remove the biofilm of the contaminated implant surfaces and to examine the possible alterations on the surface structure after  laser irradiation.

Methods: Nine failed SLA surfaced dental implants were used for laser irradiation and one unused implant served as control. Of the nine contaminated implants, eight were marked vertically to create two sides on the same implant, and the ninth contami­ nated implant was kept as a control implant of the failed implant group. One side of the contaminated implants was treated with Er,Cr:YSGG laser while the other side remained untreated. The surfaces were irradiated with a pulsed Er,Cr:YSGG laser with a power setting of 1.5 W, 15 Hz, 140 µs pulse dura­ tion for 30 seconds per thread in the non-contact mode. After macroscopic picture evaluation, light microscopic evaluation and SEM analysis were performed subsequently.

Results: SEM and light microscopy images demonstrated that Er,Cr:YSGG laser treatment with predetermined settings for titanium surfaces was able to remove all the contaminants and debris from the implant surfaces without any surface alteration which was also noticeable in the macroscopic pictures.

Conclusion: It was concluded that the use of Er,Cr:YSGG laser with current settings was efficient to decontaminate implant surfaces  and the results  of this study suggested that Er,Cr:YSGG laser can be used safely in the clinics for the treatment of peri-implantitis for biofilm removal without dama­ ging the implant surface.


Texte intégral :

PDF

Renvois

  • Il n'y a présentement aucun renvoi.